| 9453878 |
Characterization of interface resistance in a multi-layer conductive structure |
John B. Campi, Jr., Robert J. Gauthier, Jr., Junjun Li |
2016-09-27 |
| 9435841 |
Integrated circuit protection during high-current ESD testing |
Shunhua T. Chang, James P. Di Sarro, Robert J. Gauthier, Jr., Nathan Jack |
2016-09-06 |
| 9431388 |
Series-connected nanowire structures |
Robert J. Gauthier, Jr., Terence B. Hook |
2016-08-30 |
| 9425185 |
Self-healing electrostatic discharge power clamp |
Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, You Li |
2016-08-23 |
| 9413169 |
Electrostatic discharge protection circuit with a fail-safe mechanism |
James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam |
2016-08-09 |
| 9397163 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2016-07-19 |
| 9391065 |
Electrostatic discharge and passive structures integrated in a vertical gate fin-type field effect diode |
Robert J. Gauthier, Jr., Tom C. Lee, You Li, Rahul Mishra, Andreas Scholze |
2016-07-12 |
| 9349732 |
High voltage lateral double-diffused metal oxide semiconductor field effect transistor (LDMOSFET) having a deep fully depleted drain drift region |
John B. Campi, Jr., Robert J. Gauthier, Jr., Junjun Li, Rahul Mishra, Mujahid Muhammad |
2016-05-24 |
| 9281379 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2016-03-08 |
| 9240471 |
SCR with fin body regions for ESD protection |
James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam |
2016-01-19 |
| 9236374 |
Fin contacted electrostatic discharge (ESD) devices with improved heat distribution |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2016-01-12 |
