Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9330985 | Automated hybrid metrology for semiconductor device fabrication | Alok Vaid, Ned R. Saleh, Matthew Sendelbach | 2016-05-03 |
| 9262819 | System and method for estimating spatial characteristics of integrated circuits | Taher Kagalwala, Yunlin Zhang | 2016-02-16 |