Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9482519 | Measuring semiconductor device features using stepwise optical metrology | — | 2016-11-01 |
| 9262819 | System and method for estimating spatial characteristics of integrated circuits | Taher Kagalwala, Narender Rana | 2016-02-16 |