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Dynamic adjustment of operational parameters to compensate for sensor based measurements of circuit degradation |
Malcolm S. Allen-Ware, Alan J. Drake, Tilman Gloekler, Charles R. Lefurgy, Karthick Rajamani |
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| 9459599 |
Dynamic adjustment of operational parameters to compensate for sensor based measurements of circuit degradation |
Malcolm S. Allen-Ware, Alan J. Drake, Tilman Gloekler, Charles R. Lefurgy, Karthick Rajamani |
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Processor noise mitigation using differential crictical path monitoring |
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Adjustable delay calibration in a critical path monitor |
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Power management for multi-core processing systems |
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2016-05-31 |
