Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9349661 | Wafer thinning endpoint detection for TSV technology | Hanyi Ding, Oleg Gluschenkov, Ping-Chuan Wang | 2016-05-24 |
| 9258157 | Method and system for mapping bit sequences | Baoming Bai, Yajuan LUO | 2016-02-09 |