Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9417262 | Scanning probe microscope and sample observation method using same | Shuichi Baba | 2016-08-16 |
| 9267898 | Optical inspection method and optical inspection apparatus | Kenji Nakahira, Toshifumi Honda | 2016-02-23 |