Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9341582 | Method of getting tomogram used by X-ray computed tomography and X-ray computed tomography system based on its method | Yasushi NAGUMO | 2016-05-17 |
| 9274085 | Eddy current inspection device, eddy current inspection probe, and eddy current inspection method | Hisashi Endo, Akira Nishimizu | 2016-03-01 |