Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9410929 | Inspection device and inspection method | Soshi Narishige, Mitsuteru Inoue, Hiroyuki Takagi | 2016-08-09 |
| 9274085 | Eddy current inspection device, eddy current inspection probe, and eddy current inspection method | Akira Nishimizu, Noriyuki Sadaoka | 2016-03-01 |