Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9362184 | Semiconductor device, manufacturing method of semiconductor device, semiconductor manufacturing and inspecting apparatus, and inspecting apparatus | Takahiko Kato, Hiroshi Nakano, Yuuji Takada, Yoshimi Sudo, Tetsuo Fujiwara +3 more | 2016-06-07 |
| 9234861 | Electrode for electrochemical measurement, electrolysis cell for electrochemical measurement, analyzer for electrochemical measurement, and methods for producing same | Hiroshi Kanemoto, So OGUCHI, Kenta Imai, Taku Sakazume, Hiroshi Yoshida | 2016-01-12 |