DB

Dirk Beyer

CS Carl Zeiss Sms: 2 patents #1 of 24Top 5%
Overall (2016): #147,460 of 481,213Top 35%
2
Patents 2016

Issued Patents 2016

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9436080 Method and apparatus for correcting errors on a wafer processed by a photolithographic mask Vladimir Dmitriev, Ofir Sharoni, Nadav Wertsman 2016-09-06
9431212 Method for determining the performance of a photolithographic mask Markus Waiblinger, Michael Budach, Thomas Scherübl 2016-08-30