Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9396907 | Method of calibrating a scanning transmission charged-particle microscope | Abigaël Adriana Maria Kok, Martin Verheijen | 2016-07-19 |
| 9275831 | Method for S/TEM sample analysis | Jason Arjavac, Pei Zou, David Tasker, Gerhard Daniel | 2016-03-01 |