AK

Abigaël Adriana Maria Kok

FE Fei: 1 patents #24 of 108Top 25%
Overall (2016): #478,745 of 481,213Top 100%
1
Patents 2016

Issued Patents 2016

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9396907 Method of calibrating a scanning transmission charged-particle microscope Maximus Theodorus Otten, Martin Verheijen 2016-07-19