Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9435847 | Method for testing special pattern and probe card defect in wafer testing | Kai-Wen Tu, Yen-Liang Lin, Ching-Ren Cheng | 2016-09-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9435847 | Method for testing special pattern and probe card defect in wafer testing | Kai-Wen Tu, Yen-Liang Lin, Ching-Ren Cheng | 2016-09-06 |