Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7989232 | Method of using electrical test structure for semiconductor trench depth monitor | Sameer Pendharkar, Binghua Hu | 2011-08-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7989232 | Method of using electrical test structure for semiconductor trench depth monitor | Sameer Pendharkar, Binghua Hu | 2011-08-02 |