Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7989232 | Method of using electrical test structure for semiconductor trench depth monitor | Qingfeng Wang, Sameer Pendharkar | 2011-08-02 |
| 7902033 | Methods and devices for a high-k stacked capacitor | Byron Lovell Williams, Maxwell Lippitt, Betty Mercer, Scott Montgomery | 2011-03-08 |
| 7893499 | MOS transistor with gate trench adjacent to drain extension field insulation | Marie Denison, Sameer Pendharkar, Taylor R. Efland, Sridhar Seetharaman | 2011-02-22 |