Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8069733 | Device and method for measuring electromechanical properties and microstructure of nano-materials under stress state | Xiaodong Han, Yuefei Zhang, Yonghai Yue, Ze Zhang | 2011-12-06 |
| 8023583 | Method and/or system for estimating phase noise error | Yesheskel Bar-Ness | 2011-09-20 |
| 7923683 | Method for treatment of samples for transmission electron microscopes | Qi Zhang, Chorng Shyr Niou, Ming Li | 2011-04-12 |
| 7877071 | Unified STTD/CLTD dedicated pilot processing | Hongwei Kong, Li Fung Chang | 2011-01-25 |