Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8069733 | Device and method for measuring electromechanical properties and microstructure of nano-materials under stress state | Xiaodong Han, Pan Liu, Yonghai Yue, Ze Zhang | 2011-12-06 |