Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8053323 | Patterning methodology for uniformity control | Yu-Chao Lin, Ming-Ching Chang, Ryan Chia-Jen Chen, Chao-Cheng Chen | 2011-11-08 |
| 8003507 | Method of integrating high-K/metal gate in CMOS process flow | Ryan Chia-Jen Chen, Jr-Jung Lin, Yi-Shien Mor, Chien-Hao Chen, Kuo-Tai Huang +1 more | 2011-08-23 |