Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8026733 | Interface structure of wafer test equipment | Sang Hoon Lee, Chang-Woo Ko, Se-Jang Oh | 2011-09-27 |
| 7884628 | Interposer and probe card having the same | Sang Hoon Lee, Se-Jang Oh | 2011-02-08 |
| 7880490 | Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same | Sang Hoon Lee, Kwang-Yong Lee, Se-Jang Oh | 2011-02-01 |