Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8026733 | Interface structure of wafer test equipment | Sang Hoon Lee, Chang-Woo Ko, Young-Soo An | 2011-09-27 |
| 7973550 | Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same | Eun-Jo Byun, Sang Hoon Lee, Cheol-Jong Woo | 2011-07-05 |
| 7884628 | Interposer and probe card having the same | Young-Soo An, Sang Hoon Lee | 2011-02-08 |
| 7880490 | Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same | Sang Hoon Lee, Kwang-Yong Lee, Young-Soo An | 2011-02-01 |