Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7926010 | Method of determining defects in photomask | Shogo Narukawa | 2011-04-12 |
YN
Yoshikazu Nagamura
Renesas Technology: 1 patents #9 of 52Top 20%
Overall (2011): #122,432 of 364,097Top 35%
1
Patents 2011