Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7926010 | Method of determining defects in photomask | Yoshikazu Nagamura | 2011-04-12 |
SN
Shogo Narukawa
Renesas Technology: 1 patents #9 of 52Top 20%
Overall (2011): #166,494 of 364,097Top 50%
1
Patents 2011