Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8069130 | Methods and systems for semiconductor testing using a testing scenario language | — | 2011-11-29 |
| 7969174 | Systems and methods for test time outlier detection and correction in integrated circuit testing | Reed Linde, Avi Golan | 2011-06-28 |