AG

Avi Golan

OP Optimaltest: 1 patents #2 of 3Top 70%
Overall (2011): #347,996 of 364,097Top 100%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7969174 Systems and methods for test time outlier detection and correction in integrated circuit testing Gil Balog, Reed Linde 2011-06-28