TI

Tomohiro Iijima

NT Nuflare Technology: 1 patents #12 of 41Top 30%
Overall (2011): #143,074 of 364,097Top 40%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7872745 Pattern inspection apparatus and pattern inspection method Takayuki Abe, Hideo Tsuchiya, Tetsuyuki Arai 2011-01-18