YC

Yoel Cohen

NI Nova Measuring Instruments: 1 patents #3 of 4Top 75%
Overall (2011): #124,105 of 364,097Top 35%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8040532 Thin films measurement method and system Moshe Finarov, Klara Vinokur 2011-10-18