Issued Patents 2011
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8049882 | Spectrometric optical method and system providing required signal-to-noise of measurements | — | 2011-11-01 |
| 8040532 | Thin films measurement method and system | Yoel Cohen, Klara Vinokur | 2011-10-18 |
| 8023122 | Method and system for measuring patterned structures | Boaz Brill | 2011-09-20 |
| 7927184 | Method and system for endpoint detection | — | 2011-04-19 |
| 7864343 | Method and system for measuring patterned structures | Boaz Brill | 2011-01-04 |
| 7864344 | Method and system for measuring patterned structures | Boaz Brill | 2011-01-04 |