Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8011830 | Method and system for calibrating an X-ray photoelectron spectroscopy measurement | Bruno W. Schueler, Bruce H. Newcome, Jeffrey Allen Moore | 2011-09-06 |
| 7884321 | Method and system for non-destructive distribution profiling of an element in a film | Paola deCecco, Bruno W. Schueler, Michael Kwan, David S. Ballance | 2011-02-08 |