TS

Tony Schrock

Micron: 1 patents #329 of 782Top 45%
📍 Boise, ID: #212 of 511 inventorsTop 45%
🗺 Idaho: #340 of 944 inventorsTop 40%
Overall (2011): #141,159 of 364,097Top 40%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7985692 Method to reduce charge buildup during high aspect ratio contact etch Gurtej S. Sandhu, Max Hineman, Daniel A. Steckert, Jingyi Bai, Shane J. Trapp 2011-07-26