Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7873204 | Method for detecting lithographically significant defects on reticles | Mark J. Wihl, Yalin Xiong | 2011-01-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7873204 | Method for detecting lithographically significant defects on reticles | Mark J. Wihl, Yalin Xiong | 2011-01-18 |