Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7995199 | Method for detection of oversized sub-resolution assist features | Yalin Xiong | 2011-08-09 |
| 7932004 | Feature identification for metrological analysis | Yalin Xiong | 2011-04-26 |