Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8082534 | Apparatus and method for calculating fault coverage, and fault detection method | — | 2011-12-20 |
| 8051403 | Delay fault test quality calculation apparatus, delay fault test quality calculation method, and delay fault test pattern generation apparatus | Atsuo Takatori | 2011-11-01 |
| 7966138 | Apparatus for creating test pattern and calculating fault coverage or the like and method for creating test pattern and calculating fault coverage or the like | — | 2011-06-21 |
| 7913143 | Test quality evaluating and improving system for semiconductor integrated circuit and test quality evaluation and improvement method for semiconductor integrated circuit | — | 2011-03-22 |