Issued Patents 2011
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8086041 | Pattern evaluation method, pattern matching method and computer readable medium | — | 2011-12-27 |
| 8045807 | Pattern edge detecting method and pattern evaluating method | — | 2011-10-25 |
| 8041105 | Pattern evaluation method, computer-readable medium, and semiconductor device manufacturing method | — | 2011-10-18 |
| 8036445 | Pattern matching method, program and semiconductor device manufacturing method | Atsushi Onishi, Yuichiro Yamazaki | 2011-10-11 |
| 8019165 | Image processing apparatus, image processing method, defect detection method, semiconductor device manufacturing method, and program | — | 2011-09-13 |
| 8019149 | Pattern shape evaluation method and pattern shape evaluation apparatus utilizing the same | Hideaki Abe | 2011-09-13 |
| 7879309 | Method for preparing functional nanomaterials utilizing endothermic reaction | Takashi Sekiguchi, Mika Gamo, Yafei Zhang, Toshihiro Ando | 2011-02-01 |