Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8063651 | Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same | Shoji Kamata, Tomoya Sato, Toshinaga Takeya | 2011-11-22 |
| 7888958 | Current test probe having a solder guide portion, and related probe assembly and production method | Akira Souma, Yoshikazu Urushiyama, Masahisa Tazawa, Tomoya Sato, Hideki Hirakawa | 2011-02-15 |
| 7862733 | Method for manufacturing a probe | Hideki Hirakawa, Akira Soma, Kazuhito Hamada | 2011-01-04 |