Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7888958 | Current test probe having a solder guide portion, and related probe assembly and production method | Akira Souma, Yoshikazu Urushiyama, Tomoya Sato, Hideki Hirakawa, Takayuki Hayashizaki | 2011-02-15 |