Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7996743 | Logic circuit testing with reduced overhead | Jayabrata Ghosh Dastidar | 2011-08-09 |
| 7984344 | Techniques for testing memory circuits | Chin Hai Ang, Ala-Uddin Ismail, Siew Ling Yeoh | 2011-07-19 |