Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7984344 | Techniques for testing memory circuits | Tze Sin Tan, Ala-Uddin Ismail, Siew Ling Yeoh | 2011-07-19 |
| 7949916 | Scan chain circuitry for delay fault testing of logic circuits | — | 2011-05-24 |