Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7973547 | Method and apparatus for detecting a crack in a semiconductor wafer, and a wafer chuck | Alois Nitsch, Rainer Tilgner | 2011-07-05 |
HB
Horst Baumeister
Overall (2011): #284,009 of 364,097Top 80%
1
Patents 2011