Issued Patents 2011
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8086924 | Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns | Donato O. Forlenza, Orazio P. Forlenza | 2011-12-27 |
| 8065575 | Implementing isolation of VLSI scan chain using ABIST test patterns | Donato O. Forlenza, Orazio P. Forlenza | 2011-11-22 |
| 7934134 | Method and apparatus for performing logic built-in self-testing of an integrated circuit | Donato O. Forlenza, Orazio P. Forlenza, Bryan J. Robbins | 2011-04-26 |
| 7930601 | AC ABIST diagnostic method, apparatus and program product | Joseph Eckelman, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Thomas J. Knips +1 more | 2011-04-19 |
| 7921346 | Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD) | Donato O. Forlenza, Orazio P. Forlenza, Bryan J. Robbins | 2011-04-05 |
| 7908532 | Automated system and processing for expedient diagnosis of broken shift registers latch chains | Joseph Eckelman, Donato O. Forlenza, Orazio P. Forlenza, Robert B. Gass | 2011-03-15 |
| 7908534 | Diagnosable general purpose test registers scan chain design | Franco Motika, Michael R. Ouellette | 2011-03-15 |