Issued Patents 2011
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8086924 | Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns | Orazio P. Forlenza, Phong T. Tran | 2011-12-27 |
| 8065575 | Implementing isolation of VLSI scan chain using ABIST test patterns | Orazio P. Forlenza, Phong T. Tran | 2011-11-22 |
| 7934134 | Method and apparatus for performing logic built-in self-testing of an integrated circuit | Orazio P. Forlenza, Bryan J. Robbins, Phong T. Tran | 2011-04-26 |
| 7930601 | AC ABIST diagnostic method, apparatus and program product | Joseph Eckelman, Orazio P. Forlenza, William J. Hurley, Thomas J. Knips, Gary W. Maier +1 more | 2011-04-19 |
| 7921346 | Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD) | Orazio P. Forlenza, Bryan J. Robbins, Phong T. Tran | 2011-04-05 |
| 7908532 | Automated system and processing for expedient diagnosis of broken shift registers latch chains | Joseph Eckelman, Orazio P. Forlenza, Robert B. Gass, Phong T. Tran | 2011-03-15 |