MS

Mitsuo Suga

JE Jeol: 3 patents #2 of 21Top 10%
HI Hitachi: 1 patents #961 of 2,733Top 40%
Overall (2011): #23,883 of 364,097Top 7%
4
Patents 2011

Issued Patents 2011

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
8030622 Specimen holder, specimen inspection apparatus, and specimen inspection method Hidetoshi Nishiyama, Mitsuru Koizumi 2011-10-04
7928380 Sample holder, method for observation and inspection, and apparatus for observation and inspection Hidetoshi Nishiyama 2011-04-19
7906760 Inspection method and reagent solution Hidetoshi Nishiyama, Mitsuru Koizumi 2011-03-15
7876113 Method of inspecting pattern and inspecting instrument Mari Nozoe, Yoichiro Neo, Hidetoshi Nishiyama 2011-01-25