Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8045146 | Method and apparatus for reviewing defect | Yasuhiro Yoshitake, Shunichi Matsumoto, Hidetoshi Nishiyama | 2011-10-25 |
| 8040772 | Method and apparatus for inspecting a pattern shape | Takenori Hirose, Hideaki Sasazawa | 2011-10-18 |