Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7865012 | Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis program | Toshiyuki Majima, Hirotoshi Terada, Kazuhiro Hotta | 2011-01-04 |