Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7901958 | Fabrication method of semiconductor integrated circuit device | Masayoshi Okamoto, Yoshiaki Hasegawa, Yasuhiro Motoyama, Hideyuki Matsumoto, Shingo Yorisaki +4 more | 2011-03-08 |
| 7865012 | Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis program | Akira Shimase, Hirotoshi Terada, Kazuhiro Hotta | 2011-01-04 |