Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7960696 | Method for inspecting and measuring sample and scanning electron microscope | Makoto Ezumi, Junichi Kakuta, Takahiro Sato, Akira Ikegami | 2011-06-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7960696 | Method for inspecting and measuring sample and scanning electron microscope | Makoto Ezumi, Junichi Kakuta, Takahiro Sato, Akira Ikegami | 2011-06-14 |