Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8036338 | Method and device for simultaneous measurement of magnetostriction and magnetization | Etsuo Arakawa, Koichi Maruyama | 2011-10-11 |
| 7894052 | Optical defect inspection apparatus | Hiroyuki Kawakami, Kazuhiro Zama, Kazuo Takahashi, Yusuke Miyazaki, Shingo Tanaka | 2011-02-22 |