Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8035071 | Contamination-inspecting apparatus and detection circuit | Ritsurou Orihashi, Masayoshi Takahashi, Wen Li, Kengo Imagawa, Takahiro Jingu | 2011-10-11 |
| 8000045 | Inspection apparatus and inspection method of magnetic disk or magnetic head | Masayoshi Takahashi, Yoshihiro Sakurai, Hideki Mochizuki | 2011-08-16 |
| 8000047 | Inspection apparatus and inspection method of magnetic disk or magnetic head | Masayoshi Takahashi, Shinji Homma, Yoshihiro Sakurai | 2011-08-16 |
| 7990529 | Detection circuit and foreign matter inspection apparatus for semiconductor wafer | Ritsuro Orihashi, Takahiro Jingu | 2011-08-02 |