Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7986405 | Foreign matter inspection method and foreign matter inspection apparatus | Hiroyuki Yamashita, Mamoru Kobayashi, Eiji Imai, Yoshio Morishige, Hideki Fukushima | 2011-07-26 |