Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7999932 | Inspection apparatus and inspection method | Hiroyuki Yamashita, Yukihisa Mohara | 2011-08-16 |
| 7986405 | Foreign matter inspection method and foreign matter inspection apparatus | Hiroyuki Yamashita, Mamoru Kobayashi, Yoshio Morishige, Koichi Nagoya, Hideki Fukushima | 2011-07-26 |
| 7898653 | Foreign matter inspection apparatus | Masami Ooyama, Hideyuki Okamoto, Hiroyuki Yamashita | 2011-03-01 |