Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8072592 | Reticle defect inspection apparatus and reticle defect inspection method | Riki Ogawa | 2011-12-06 |
| 8073011 | Pseudo base station apparatus | Keiji Kameda, Nobumitsu Umezawa, Olivier Genound | 2011-12-06 |
| 7911599 | Reticle defect inspection apparatus and reticle defect inspection method | Riki Ogawa | 2011-03-22 |
| 7906186 | Ink jet recording medium | Hiroshi Yamamoto, Taihei Noshita, Kouichi Sasaki | 2011-03-15 |